Sina Jahanabin
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 September 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Inspection, Wavelets, Feature extraction, Visualization, LabVIEW, Optical inspection, Image filtering, Image processing, Electronic filtering, Machine vision

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