Siping Peng
at Shanghai Radio Equipment Research Institute
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 16 December 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Digital holography, Interferometry, Optical testing, Phase measurement

Proceedings Article | 13 November 2019 Paper
Proc. SPIE. 11343, Ninth International Symposium on Precision Mechanical Measurements

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Calibration, Manufacturing, Optical testing, Deflectometry, Ray tracing

Proceedings Article | 6 February 2019 Paper
Proc. SPIE. 10842, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subdiffraction-limited Plasmonic Lithography and Innovative Manufacturing Technology
KEYWORDS: Polishing, Robots, Deconvolution, Optics manufacturing

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