Prof. Sitian Gao
at National Institute of Metrology
SPIE Involvement:
Author
Publications (17)

PROCEEDINGS ARTICLE | November 15, 2017
Proc. SPIE. 10605, LIDAR Imaging Detection and Target Recognition 2017

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Metrology, Crystals, X-ray diffraction

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Atomic force microscope

PROCEEDINGS ARTICLE | November 5, 2015
Proc. SPIE. 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
KEYWORDS: Human-machine interfaces, Metrology, LabVIEW, Interferometers, Ceramics, Interfaces, Control systems, Data acquisition, Signal generators, Control systems design

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Metrology, Optical spheres, X-ray computed tomography, Sensors, Calibration, X-rays, X-ray sources, 3D metrology, Printed circuit board testing, Standards development

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Metrology, Optical spheres, Sensors, Calibration, Error analysis, X-rays, Reconstruction algorithms, Picosecond phenomena, Printed circuit board testing, Standards development

Showing 5 of 17 publications
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