Sohichiro Nakamura
at FUJIFILM Corp
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | July 29, 2015
JBO Vol. 20 Issue 07
KEYWORDS: Skin, Optical coherence tomography, Ultraviolet radiation, Optical filters, Visible radiation, Light, Tomography, Spectroscopy, Light sources, In situ metrology

PROCEEDINGS ARTICLE | August 6, 2014
Proc. SPIE. 9232, International Conference on Optical Particle Characterization (OPC 2014)
KEYWORDS: Light sources, Scattering, Particles, Diffusion, Light scattering, Laser scattering, Transmission electron microscopy, Dynamic light scattering, Multiple scattering, Signal detection

PROCEEDINGS ARTICLE | August 6, 2014
Proc. SPIE. 9232, International Conference on Optical Particle Characterization (OPC 2014)
KEYWORDS: Sensors, Nanoparticles, Particles, Diffusion, Light scattering, Dynamic light scattering, Multiple scattering, Collimators, Signal detection, Particle sizing

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Confocal microscopy, Mach-Zehnder interferometers, Nanoparticles, Particles, Light scattering, Transmission electron microscopy, Dynamic light scattering, Multiple scattering, Heterodyning, Particle sizing

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