Dr. Solomon A. Gugsa
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 September 2005 Paper
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Monte Carlo methods, Aspheric lenses, Error analysis, Monochromatic aberrations, Optical testing, Data centers, Zernike polynomials, Interferometry, Objectives, Calibration

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