Dr. Solomon A. Gugsa
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 September 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Monochromatic aberrations, Calibration, Error analysis, Interferometry, Optical testing, Monte Carlo methods, Zernike polynomials, Objectives, Aspheric lenses, Data centers

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