Dr. Songyot Nakariyakul
Associate Professor at Thammasat Univ
SPIE Involvement:
Author
Area of Expertise:
Hyperspectral Image Processing , Real-time Optical Product Inspection Systems , Distortion-invariant Pattern Recognition
Websites:
Publications (12)

Proceedings Article | 5 November 2014
Proc. SPIE. 9273, Optoelectronic Imaging and Multimedia Technology III
KEYWORDS: Hyperspectral imaging, Agriculture, Detection and tracking algorithms, Polarization, Sensors, Remote sensing, Vegetation, Image classification, Feature selection, Algorithm development

SPIE Journal Paper | 1 August 2008
OE Vol. 47 Issue 08
KEYWORDS: Databases, Feature selection, Feature extraction, Skin, Detection and tracking algorithms, Forward error correction, Inspection, Optical engineering, Colon, Reflectivity

Proceedings Article | 12 October 2007
Proc. SPIE. 6761, Optics for Natural Resources, Agriculture, and Foods II
KEYWORDS: Detection and tracking algorithms, Databases, Skin, Inspection, Reflectivity, Feature extraction, Feature selection, Colon, Forward error correction, Binary data

Proceedings Article | 12 October 2007
Proc. SPIE. 6761, Optics for Natural Resources, Agriculture, and Foods II
KEYWORDS: Detection and tracking algorithms, Databases, Skin, Inspection, Reflectivity, Feature extraction, Feature selection, Colon, Forward error correction, Binary data

Proceedings Article | 7 May 2007
Proc. SPIE. 6565, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XIII
KEYWORDS: Hyperspectral imaging, Contamination, Detection and tracking algorithms, Databases, Skin, Inspection, Feature extraction, Feature selection, Forward error correction, Binary data

Showing 5 of 12 publications
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