Dr. Sonko Osawa
at National Metrology Institute of Japan
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 14 September 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Mirrors, Beam splitters, Lasers, Interferometers, Sensors, Receivers, Autocollimators, Laser stabilization, Motion measurement, Laser systems engineering

Proceedings Article | 29 August 2008
Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI
KEYWORDS: Metrology, 3D imaging standards, Calibration, Coating, Manufacturing, Reflectivity, Chromium, 3D metrology, Standards development, Tin

Proceedings Article | 11 August 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Refractive index, Beam splitters, Ferroelectric materials, Interferometers, Glasses, Interferometry, Optical testing, Wavelength tuning, Phase measurement, Fizeau interferometers

Proceedings Article | 19 August 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Metrology, Calibration, Glasses, Manufacturing, Data acquisition

Proceedings Article | 18 August 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Metrology, Interferometers, Calibration, Ceramics, Photography, Manufacturing, Relays, Dysprosium, Standards development, Temperature metrology

Showing 5 of 10 publications
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