Prof. Spyros Gallis
Assistant Professor at SUNY CNSE/SUNYIT
SPIE Involvement:
Author
Area of Expertise:
Nanostructured systems , Materials science , Thin films characterization , Silicon oxycarbide and rare-earth oxide related materials , Physical failure analysis , Semiconductors
Websites:
Profile Summary

Dr. Spyridon Galis (Academic: Spyros Gallis)) is a professor in the SUNY Polytechnic Institute (College of Nanoscale Science and Engineering (CNSE)). He was a senior engineer/ scientist at International Business Machines (IBM) Microelectronics’ Semiconductor Research and Development Center (SRDC) (2006 – 2014). He received his Ph.D. degree in Nanoscale Science from SUNY Albany (New York) in 2006. His primary academic research interests are the design, synthesis and characterization of nanomaterials and nanostructured systems and devices, in addition to the development of photonic and optoelectronic systems for Si-based nano- photonics and biophotonics. Concurrently, his semiconductor-related research focuses are the advanced CMOS chip process integration and characterization, as well as physical failure analysis (PFA) and the development of defect localization methodologies for CMOS technologies. He has a strong grasp of the tools, methodologies and characterization used in thin-film deposition science and technology. He has become a recognized expert in his fields (PFA, silicon oxycarbide and rare-earth oxide related materials) and has served as paper reviewer for several journals.
Publications (4)

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8463, Nanoengineering: Fabrication, Properties, Optics, and Devices IX
KEYWORDS: Oxides, Thin films, Annealing, Luminescence, X-ray diffraction, Silicon, Silicon films, Erbium, Silicates, Oxidation

PROCEEDINGS ARTICLE | September 24, 2011
Proc. SPIE. 8123, Eleventh International Conference on Solid State Lighting
KEYWORDS: Amorphous silicon, Thin films, Visible radiation, Eye, Argon, Annealing, Luminescence, Silicon, Silicon films, Absorption

PROCEEDINGS ARTICLE | September 9, 2008
Proc. SPIE. 7039, Nanoengineering: Fabrication, Properties, Optics, and Devices V
KEYWORDS: Thin films, Optical properties, Annealing, Luminescence, Silicon, Hydrogen, Chemical vapor deposition, Oxygen, Silicon films, Erbium

PROCEEDINGS ARTICLE | September 4, 2008
Proc. SPIE. 7030, Nanophotonic Materials V
KEYWORDS: Amorphous silicon, Thin films, FT-IR spectroscopy, Silica, Annealing, Luminescence, Ions, Silicon, Erbium, Silicon photonics

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