Sri-Kaushik Pavani
at Texas Tech Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 3, 2004
Proc. SPIE. 5303, Machine Vision Applications in Industrial Inspection XII
KEYWORDS: Signal attenuation, Image segmentation, Image processing, Particles, X-rays, Tomography, Image classification, X-ray imaging, Fuzzy logic, 3D image processing

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