Stanislav Tereschenko
Research Associate at Univ Kassel
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical components, Nanostructures, Interferometers, Cameras, Image processing, Interferometry, Ultrasonics, Transducers, Distance measurement, 3D metrology, Environmental sensing

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Temporal coherence, Refractive index, Light sources, Mirau interferometers, Interferometers, Calibration, Polymers, Interferometry, Optical testing, Halogens

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Mirrors, Light emitting diodes, Interferometers, Cameras, Sensors, Distance measurement, 3D metrology, Objectives, Charge-coupled devices, Environmental sensing

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