Stefan Adamsmair
at Johannes Kepler Univ of Linz
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 October 2005
Proc. SPIE. 5965, Optical Fabrication, Testing, and Metrology II
KEYWORDS: Digital signal processing, Molecules, Photodiodes, Atomic force microscopy, Signal processing, Receptors, Analog electronics, Electronic filtering, Filtering (signal processing), Temperature metrology

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