Dr. Stefan P. Hau-Riege
Physicist at Lawrence Livermore National Lab
SPIE Involvement:
Conference Chair | Author | Editor
Publications (20)

Proceedings Article | 5 June 2018
Proc. SPIE. 10691, Advances in Optical Thin Films VI
KEYWORDS: Multilayers, Data modeling, X-rays, Interfaces, Silicon, Reflectivity, Silicon carbide, Molybdenum, Systems modeling

Proceedings Article | 21 June 2017
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Photons, Electrons, Materials processing, Physics, Raman spectroscopy, Analytical research, Free electron lasers, States of matter, Stanford Linear Collider, Lead

Proceedings Article | 22 September 2015
Proc. SPIE. 9589, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI
KEYWORDS: Mirrors, Polishing, X-rays, Coating, Wavefronts, Laser beam diagnostics, Free electron lasers, Zerodur, Iridium, Liquid crystal lasers

Proceedings Article | 9 September 2015
Proc. SPIE. 9591, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV
KEYWORDS: Microscopes, Mirrors, Multilayers, Sensors, Calibration, X-rays, Reflectivity, Spatial resolution, X-ray imaging, National Ignition Facility

Proceedings Article | 8 October 2014
Proc. SPIE. 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
KEYWORDS: Mirrors, Crystals, X-rays, Silicon, Diodes, Laser crystals, Semiconducting wafers, Hard x-rays, Prototyping, Liquid crystal lasers

Showing 5 of 20 publications
Conference Committee Involvement (2)
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
18 August 2014 | San Diego, California, United States
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
14 August 2012 | San Diego, California, United States
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