Dr. Stefan Heist
Group Leader 3D Sensors at Fraunhofer IOF
SPIE Involvement:
Conference Program Committee | Author
Websites:
Publications (37)

Proceedings Article | 4 October 2023 Presentation + Paper
Proceedings Volume 12672, 126720H (2023) https://doi.org/10.1117/12.2675748
KEYWORDS: Sensors, Cameras, 3D metrology, RGB color model, Near infrared, 3D acquisition, Object recognition, Environmental sensing

Proceedings Article | 15 August 2023 Presentation + Paper
Proceedings Volume 12618, 126180H (2023) https://doi.org/10.1117/12.2673385
KEYWORDS: 3D metrology, Cameras, Thermography, 3D modeling, Temperature metrology, 3D image processing, Temperature distribution, Stereoscopic cameras, Optical spheres, Infrared cameras

Proceedings Article | 16 June 2023 Presentation + Paper
Stefan Heist, Roland Ramm, Mohsen Mozaffari-Afshar, Daniel Höhne, Thomas Hilbert, Henri Speck, Siemen Kühl, Daniela Hoffmann, Sebastian Erbes, Peter Kühmstedt, Gunther Notni
Proceedings Volume 12524, 1252406 (2023) https://doi.org/10.1117/12.2661183
KEYWORDS: 3D metrology, Cameras, Focus stacking, Modulation transfer functions, Depth of field, Projection systems, Sensors, 3D image processing, Stereoscopy

Proceedings Article | 12 June 2023 Presentation + Paper
Proceedings Volume 12536, 125360P (2023) https://doi.org/10.1117/12.2663331
KEYWORDS: 3D metrology, Cameras, Long wavelength infrared, Mid-IR, Sensors, Time metrology, Gas lasers, 3D projection, 3D image processing, Spinel

Proceedings Article | 31 May 2022 Presentation + Paper
Patrick Dietrich, Florian Siegmund, Christian Bräuer-Burchardt, Stefan Heist, Gunther Notni
Proceedings Volume 12098, 120980B (2022) https://doi.org/10.1117/12.2617069
KEYWORDS: Cameras, Robots, Sensors, Safety, Distance measurement, 3D metrology, Calibration, Optical sensors

Showing 5 of 37 publications
Conference Committee Involvement (6)
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XI
5 April 2022 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications X
12 April 2021 | Online Only, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Showing 5 of 6 Conference Committees
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