Dr. Stefan G. Kasperl
at Fraunhofer-IIS
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 5, 2010
Proc. SPIE. 7723, Optics, Photonics, and Digital Technologies for Multimedia Applications
KEYWORDS: Signal to noise ratio, Visible radiation, Metrology, Contamination, Sensors, Calibration, X-rays, Tungsten, Quantum efficiency, Molybdenum

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Edge detection, Contamination, Detection and tracking algorithms, Cameras, Sensors, X-rays, Tungsten, Manufacturing, Inspection, Molybdenum

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