Dr. Stefan P. Moeller
at SLAC National Accelerator Lab
SPIE Involvement:
Conference Program Committee | Conference Chair | Author | Editor
Publications (10)

Proceedings Article | 24 April 2019
Proc. SPIE. 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V
KEYWORDS: Infrared imaging, X-ray optics, Water, Photons, X-rays, Infrared spectroscopy, Free electron lasers, Liquid crystal lasers, Liquids, Absorption

Proceedings Article | 24 April 2019
Proc. SPIE. 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V
KEYWORDS: Sensors, Calibration, X-rays, Free electron lasers, Power meters

Proceedings Article | 24 April 2019
Proc. SPIE. 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V
KEYWORDS: X-rays, Diagnostics, X-ray detectors, Hard x-rays, Free electron lasers, Power meters

Proceedings Article | 21 June 2017
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Photons, Electrons, Materials processing, Physics, Raman spectroscopy, Analytical research, Free electron lasers, States of matter, Stanford Linear Collider, Lead

Proceedings Article | 16 June 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Mirrors, Sensors, X-rays, Laser development, Reflectivity, Free electron lasers, Power meters, Stanford Linear Collider, Liquid crystal lasers, Temperature metrology

Showing 5 of 10 publications
Conference Committee Involvement (6)
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications
24 April 2017 | Prague, Czech Republic
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI
12 August 2015 | San Diego, California, United States
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
18 August 2014 | San Diego, California, United States
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X
27 August 2013 | San Diego, California, United States
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
14 August 2012 | San Diego, California, United States
Showing 5 of 6 published special sections
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