Prof. Stefan J. Rinner
at NTB
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | November 13, 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Antireflective coatings, Laser induced damage, Coating, Ion beams, Humidity, Laser damage threshold

PROCEEDINGS ARTICLE | December 6, 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Optical components, Antireflective coatings, Silica, Laser induced damage, Ultraviolet radiation, Optical coatings, Optical testing, Laser irradiation, Laser damage threshold, Temperature metrology

PROCEEDINGS ARTICLE | November 11, 2016
Proc. SPIE. 10151, Optics and Measurement International Conference 2016
KEYWORDS: Diffraction, Transparency, Wavefronts, Optical testing, Wave propagation, Ronchi rulings, Spherical lenses, Optics manufacturing, Light wave propagation, Diffraction gratings

PROCEEDINGS ARTICLE | November 23, 2015
Proc. SPIE. 9632, Laser-Induced Damage in Optical Materials: 2015
KEYWORDS: Multilayers, Polishing, Silica, Sputter deposition, Laser induced damage, Manufacturing, Optical coatings, Ion beams, Laser damage threshold, Optics manufacturing

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Optical filters, Light sources, Lenses, Sensors, Ultraviolet radiation, Interference (communication), Distance measurement, Optical simulations, Charge-coupled devices, Signal detection

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Light emitting diodes, Imaging systems, Cameras, Calibration, Inspection, Image acquisition, 3D metrology, Projection systems, Semiconducting wafers, Content addressable memory

Showing 5 of 7 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top