Dr. Stefano Marchesini
at Lawrence Berkeley National Lab
SPIE Involvement:
Conference Program Committee | Author
Publications (9)

Proceedings Article | 19 October 2012
Proc. SPIE. 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
KEYWORDS: Diffraction, Optical spheres, Scattering, Sensors, Aerosols, Photons, X-rays, Wavefronts, Profiling, Free electron lasers

Proceedings Article | 15 October 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Sensors, X-rays, Charge-coupled devices, Modulation transfer functions, Spatial resolution, Coded apertures, Algorithm development, X-ray imaging, Coded aperture imaging, X-ray detectors

Proceedings Article | 21 May 2011
Proc. SPIE. 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation
KEYWORDS: Diffraction, Coherence imaging, Light sources, Sensors, Particles, X-rays, X-ray diffraction, X-ray imaging, Free electron lasers, Liquid crystal lasers

Proceedings Article | 2 September 2010
Proc. SPIE. 7800, Image Reconstruction from Incomplete Data VI
KEYWORDS: Signal to noise ratio, Light sources, Radon, Phase contrast, Sensors, X-rays, Fourier transforms, Tomography, Radon transform, Hard x-rays

Proceedings Article | 27 August 2010
Proc. SPIE. 7800, Image Reconstruction from Incomplete Data VI
KEYWORDS: Diffraction, Light sources, Optical spheres, 3D image reconstruction, Molecules, X-rays, X-ray diffraction, Fourier transforms, Molecular lasers, 3D image processing

SPIE Journal Paper | 1 May 2010
OE Vol. 49 Issue 05
KEYWORDS: Modulation transfer functions, Calibration, Spatial frequencies, Binary data, Profilometers, Etching, Microscopes, Scanning probe microscopy, Interferometry, Silicon

Showing 5 of 9 publications
Conference Committee Involvement (1)
Image Reconstruction from Incomplete Data VI
2 August 2010 | San Diego, California, United States
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