Dr. Stephan Waldner
Senior Scientist at Evatec AG
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | October 4, 2011
Proc. SPIE. 8168, Advances in Optical Thin Films IV
KEYWORDS: Thin films, Refractive index, Diffractive optical elements, Resistance, Reflectivity, Surface roughness, Oxygen, Transmittance, Plasma, Absorption

PROCEEDINGS ARTICLE | August 17, 1999
Proc. SPIE. 3745, Interferometry '99: Applications

PROCEEDINGS ARTICLE | September 17, 1997
Proc. SPIE. 3098, Optical Inspection and Micromeasurements II
KEYWORDS: Mirrors, Beam splitters, Polarization, Image processing, Interferometry, Speckle pattern, Optoelectronics, Signal processing, Finite element methods, Aluminum

PROCEEDINGS ARTICLE | November 15, 1996
Proc. SPIE. 2944, Nondestructive Evaluation of Materials and Composites
KEYWORDS: Mirrors, Fringe analysis, Foam, Image processing, Interferometry, Nondestructive evaluation, Speckle pattern, Phase measurement, Shearography, Phase shifts

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