In this work we want to demonstrate how the methodology of Design of Experiment (DOE) can be used for the
development of ion-assisted ITO films deposited at low temperatures. The optimization method allows us to identify the
process parameters, which yield films with high transmittance and low resistivity. The article will show the results
obtained for transmittance and resistivity. Furthermore, the dispersion of the refractive index and the extinction
coefficient will be determined as well as the surface roughness. In ITO there is a trade-off between transmittance /
absorbance and sheet resistance. Virtually absorption free films could be obtained with a resistivity of 3.2 μΩm, whereas
the lowest resistivity (2.7 μΩm) yielded a transmittance, which was reduced by a few percent.
In this manuscript we present the development of an integrated shearography system that is able to measure the 3D deformation of an object surface. In order to determine all six displacement derivatives that may contribute to shearography results, six measurements with three different sensitivity directions and two shear directions have to be performed. The realized system is able to perform this measurement sequence in an automated way.
Electronic speckle pattern shearing interferometry (ESPSI) allows for the measurement of displacement derivative maps. To monitor the stress/strain state of an object surface and its material properties, it is necessary to measure more than one displacement derivative map. The conventional configuration of ESPSI has been modified by parallel adaptation of Michelson shearing interferometers and an optoelectronic/image processing head with the capability of simultaneous capturing of 2 images. The automatic analysis of speckle fields is performed by temporal phase stepping method with the separation of the information by orthogonal polarization states. In the paper the opto-mechanical and electronic configuration of the system is presented. The experimental results obtained in the modified ESPIS system, when applied to determination of shear strain in a tensile loaded aluminium specimen are also presented.
Recently, a method to remove the effect of the shear distance from shearographic recordings by reconstruction of the displacement field was presented. Conventional phase- shifting shearography is used to obtain a phase map which represents an approximation to the displacement derivative. To calculate the displacement information of r a point in the final image, the phase values of certain image points of the shearogram are added. Applying this summation top all image points results in a phase map representing the displacement field with the effect of image-doubling removed. This manuscript concentrates on the experimental verification of the effect and shows the application to the measurement of out-of-plane as well as in-plane deformation. The method combines the advantages of conventional shearography and electronic speckle pattern interferometry displacement measurement. It uses the same optical set-up as shearography, which has proved its applicability in industrial environments, and delivers the displacement field with the effect of image-doubling removed. This displacement field is easier to interpret than the approximated displacement derivative of conventional shearography.