Dr. Stéphane Perrin
Postdoctoral researcher at ICube
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Photonics , Microscopy , Optical Coherence Tomography , Interferometry , Digital Holography
Profile Summary

I obtained my BSc at the University of Strasbourg and my MSc degree at the University of Bourgogne.

In 2010, I worked as a scientific assistant within Prof. Christian Depeursinge’s Microvision and Microdiagnostics Group, at the École Polytechnique Fédérale de Lausanne. I developed a new low coherence digital holographic microscopy technique for biological imaging. Then, from 2011 to 2012, as research engineer in the private research laboratory Dynamic 3D, I was in charge of the development of special devices for industrial partners.

Afterwards, in 2012, I joined the academic research at FEMTO-ST institute where I obtained my PhD under Prof. Christophe Gorecki's supervision. My topic consisted in the development and the characterization of an optical coherence tomography micro-system.

Now, I'm postdoctoral researcher in the Photonics Instrumentation and Processes group of ICube institute.
Publications (13)

PROCEEDINGS ARTICLE | March 14, 2018
Proc. SPIE. 10500, Single Molecule Spectroscopy and Superresolution Imaging XI
KEYWORDS: Microscopy, Super resolution, Image resolution, Dielectrics, Optical microscopes, Photonic nanostructures, Real time imaging, Spatial resolution, Image acquisition, Near field optics

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Microscopy, Image resolution, Interferometry, Photonic nanostructures, Near field optics, Interferometers, Metrology, Diffraction, Inspection, Glasses

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Spectral resolution, Optical microscopy, Optical resolution, Optical microscopes, Geometrical optics, Super resolution, Light sources, Refractive index, Microscopy, Image resolution, Super resolution microscopy, Diffraction, Near field, Coherence imaging, Modeling

PROCEEDINGS ARTICLE | April 27, 2016
Proc. SPIE. 9888, Micro-Optics 2016
KEYWORDS: Optical components, Polishing, Micro optics, Glasses, Optical aberrations, Semiconducting wafers, Microlens

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Skin, Microopto electromechanical systems, Optical coherence tomography, Microsystems, Mirrors, Silicon, Semiconducting wafers, Beam splitters

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Wavefronts, Phase retrieval, Microlens, Interferometry, Micro optics, Metrology, Optical components, Optical properties, Optical aberrations, Imaging systems, Digital holography, Microscopes, Objectives, Wave propagation

Showing 5 of 13 publications
Conference Committee Involvement (2)
Interferometry XIX
21 August 2018 | San Diego, California, United States
Photonics Europe 2008
7 April 2008 |
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