Stéphane ferraton
at IMEP
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Oxides, Superposition, Silica, Interfaces, Silicon, Microelectronics, Measurement devices, Low pressure chemical vapor deposition, Field effect transistors, Nanocrystals

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