Stephen H. Black
at RTX Corp
SPIE Involvement:
Publications (8)

Proceedings Article | 21 May 2011 Paper
S. Black, T. Sessler, E. Gordon, R. Kraft, T. Kocian, M. Lamb, R. Williams, T. Yang
Proceedings Volume 8012, 80121A (2011)
KEYWORDS: Semiconducting wafers, Resistance, Sensors, Bolometers, Microbolometers, Silicon, Readout integrated circuits, Reticles, Process control, Electronics

Proceedings Article | 4 May 2010 Paper
S. Black, R. Kraft, A. Medrano, T. Kocian, D. Bradstreet, R. Williams, T. Yang
Proceedings Volume 7660, 76600X (2010)
KEYWORDS: Bolometers, Calibration, Sensors, Packaging, Manufacturing, Semiconducting wafers, Process control, Resistance, Silicon, Vanadium

Proceedings Article | 15 May 2008 Paper
S. Black, M. Ray, C. Hewitt, R. Wyles, E. Gordon, K. Almada, S. Baur, M. Kuiken, D. Chi, T. Sessler
Proceedings Volume 6940, 694022 (2008)
KEYWORDS: Sensors, Staring arrays, Microbolometers, Cameras, Electronics, Thermography, Interfaces, Video, Readout integrated circuits, Nonuniformity corrections

Proceedings Article | 14 May 2007 Paper
D. Murphy, M. Ray, J. Wyles, C. Hewitt, R. Wyles, E. Gordon, K. Almada, T. Sessler, S. Baur, D. Van Lue, S. Black
Proceedings Volume 6542, 65421Z (2007)
KEYWORDS: Sensors, Staring arrays, Microbolometers, Readout integrated circuits, Electronics, Thermography, Bolometers, Interfaces, Silicon, Power supplies

Proceedings Article | 30 August 2004 Paper
David Gulbransen, Stephen Black, A. Childs, Christopher Fletcher, Scott Johnson, William Radford, Gregory Venzor, J. Sienicki, A. Thompson, J. Griffith, Aimee Buell, M. Vilela, Michael Newton, Edward Takken, James Waterman, Keith Krapels
Proceedings Volume 5406, (2004)
KEYWORDS: Staring arrays, Sensors, Semiconducting wafers, Electronics, Detector arrays, Mid-IR, Mercury cadmium telluride, Silicon, Cameras, Interfaces

Showing 5 of 8 publications
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