Mr. Stephen J. Bruner
at NuSil Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 8, 2004
Proc. SPIE. 5590, Sensors for Harsh Environments
KEYWORDS: Refractive index, Electronics, Sensors, Polymers, Silicon, Chemistry, Resistance, Platinum, Optics manufacturing, Temperature metrology

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