Steve Tuenge
Senior Staff Engineer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 May 2017 Paper
N. Nye, A. Swisher, C. Bungay, S. Tuenge, T. Mayer, D. Christodoulides, C. Rivero-Baleine
Proceedings Volume 10181, 101810J (2017) https://doi.org/10.1117/12.2262026
KEYWORDS: Tantalum, Polarization, Silica, Refractive index, Silicon, Etching, Antireflective coatings, Finite element methods, Mid-IR, Multilayers

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