Dr. Steven D. Phillips
Leader/Physicist at National Institute of Standards and Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (2)

PROCEEDINGS ARTICLE | January 19, 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: Metrology, Optical spheres, 3D imaging standards, Imaging systems, Calibration, Manufacturing, Optical testing, 3D metrology, Dimensional metrology, Standards development

PROCEEDINGS ARTICLE | October 22, 2001
Proc. SPIE. 4401, Recent Developments in Traceable Dimensional Measurements
KEYWORDS: Metrology, Calibration, Silicon, Manufacturing, Industrial metrology, Iodine cells, Software development, Helium neon lasers, Environmental sensing, Standards development

Conference Committee Involvement (2)
3D Imaging Metrology
24 January 2011 | San Francisco Airport, California, United States
3D Imaging Metrology
19 January 2009 | San Jose, California, United States
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