Dr. Stuart Friedman
at PrimeNano Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 27, 2014
Proc. SPIE. 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
KEYWORDS: Thin films, Metrology, Modulation, Graphene, Calibration, Microscopy, Dielectrics, Atomic force microscopy, Microwave radiation, Crystal optics

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