Sudhir Kumar Saini
at Indian Institute of Technology Ropar
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 December 2019 Paper
Proceedings Volume 11201, 112010R (2019) https://doi.org/10.1117/12.2538476
KEYWORDS: Reflectivity, Nanowires, Silicon, Refractive index, Photonic nanostructures, Polarization, Silicon photonics, Optical microscopes, Nanostructures, Statistical analysis

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