Prof. Sug-Whan Kim
at Yonsei Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (48)

PROCEEDINGS ARTICLE | May 10, 2018
Proc. SPIE. 10636, Laser Radar Technology and Applications XXIII
KEYWORDS: Staring arrays, Modulation, Sensors, Image processing, Scanners, Linear filtering, Ray tracing, Transmittance, Stray light analysis, Optical filtering

PROCEEDINGS ARTICLE | May 2, 2018
Proc. SPIE. 10641, Sensors and Systems for Space Applications XI
KEYWORDS: Optical components, Monochromatic aberrations, Mirrors, Wavefronts, Frequency modulation, Fermium, Optical alignment, Silicon carbide, Optics manufacturing, Off axis mirrors

PROCEEDINGS ARTICLE | October 21, 2016
Proc. SPIE. 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII
KEYWORDS: Infrared sensors, Gradient-index optics, GRIN lenses, Refractive index, Sensors, Computer simulations, Image sensors, Sapphire, Ray tracing, Geometrical optics

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 9999, Remote Sensing of the Ocean, Sea Ice, Coastal Waters, and Large Water Regions 2016
KEYWORDS: Near infrared, Point spread functions, Avalanche photodetectors, Imaging systems, Sensors, Satellites, Image analysis, Atmospheric corrections, Modulation transfer functions, Spatial resolution

PROCEEDINGS ARTICLE | November 16, 2015
Proc. SPIE. 9575, Optical Manufacturing and Testing XI
KEYWORDS: Mirrors, Scattering, Cameras, Sensors, Error analysis, Computer simulations, Image analysis, Zernike polynomials, Ray tracing, Device simulation

PROCEEDINGS ARTICLE | September 16, 2015
Proc. SPIE. 9605, Techniques and Instrumentation for Detection of Exoplanets VII
KEYWORDS: Diffraction, Telescopes, Apodization, Opacity, Reflectivity, Wavefronts, Exoplanets, Space telescopes, Collimation, Space operations

Showing 5 of 48 publications
Conference Committee Involvement (3)
Optical Manufacturing and Testing XII
20 August 2018 | San Diego, California, United States
Optical Manufacturing and Testing XI
9 August 2015 | San Diego, California, United States
Optical Design and Testing II
8 November 2004 | Beijing, China
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