Prof. Suk In Yoo
at Seoul National Univ
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 17 March 2017
Proc. SPIE. 10341, Ninth International Conference on Machine Vision (ICMV 2016)
KEYWORDS: Visual process modeling, Defect detection, Data modeling, Organic light emitting diodes, Inspection, Computer science, Motion models, Statistical modeling, Fuzzy logic, Data analysis

SPIE Journal Paper | 14 September 2012
JEI Vol. 21 Issue 3
KEYWORDS: Defect detection, Binary data, Detection and tracking algorithms, Semiconducting wafers, Scanning electron microscopy, Image processing, Inspection, Optimization (mathematics), Image analysis, Expectation maximization algorithms

Proceedings Article | 6 May 2010
Proc. SPIE. 7723, Optics, Photonics, and Digital Technologies for Multimedia Applications
KEYWORDS: Image processing algorithms and systems, Data modeling, Image segmentation, Image processing, Feature extraction, Computer science, Scanning electron microscopy, Computer engineering, Semiconducting wafers, Statistical modeling

SPIE Journal Paper | 1 July 2008
JEI Vol. 17 Issue 03
KEYWORDS: Visibility, Visualization, Thin films, Transistors, Inspection, Defect detection, Detection and tracking algorithms, Liquid crystals, LCDs, Feature extraction

Proceedings Article | 26 February 2008
Proc. SPIE. 6813, Image Processing: Machine Vision Applications
KEYWORDS: Thin films, Defect detection, Sensors, Image segmentation, Image processing, Inspection, Process control, Signal detection, Array processing, Defect inspection

Showing 5 of 10 publications
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