Mr. Sunho Lee
at Texas Tech Univ
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | July 1, 2004
JEI Vol. 13 Issue 03
KEYWORDS: Image processing, Feature extraction, Cameras, Fractal analysis, Edge detection, Image acquisition, Imaging systems, Laser systems engineering, 3D modeling, Statistical modeling

PROCEEDINGS ARTICLE | May 1, 2003
Proc. SPIE. 5132, Sixth International Conference on Quality Control by Artificial Vision
KEYWORDS: Edge detection, Visualization, Imaging systems, Cameras, Image acquisition, 3D modeling, Feature extraction, Profiling, 3D metrology, Laser systems engineering

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