Dr. Sunil Bean
at Argonne National Lab
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Microscopes, Mirrors, Microscopy, X-rays, X-ray microscopy, Nanoprobes, Finite element methods, Spatial resolution, Mechanical engineering, Hard x-rays

Proceedings Article | 7 September 2017 Presentation + Paper
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII

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