Susan M. Hojnacki
at Rochester Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 September 2004
Proc. SPIE. 5493, Optimizing Scientific Return for Astronomy through Information Technologies
KEYWORDS: X-ray optics, Statistical analysis, Stars, Data modeling, X-rays, X-ray sources, Charge-coupled devices, Algorithm development, X-ray astronomy, X-ray detectors

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