Dr. Susumu Hattori
Professor at Fukuyama Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 22, 2003
Proc. SPIE. 5011, Machine Vision Applications in Industrial Inspection XI
KEYWORDS: Metrology, Imaging systems, Cameras, Image segmentation, Inspection, CCD cameras, Photogrammetry, Antennas, Target recognition, Automatic target recognition

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