Dr. Suyun Yoo
at Max-Planck-Institut für Eisenforschung GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 March 2023 Presentation
T. Schulz, L. Lymperakis, S.-H. Yoo, Artur Lachowski, H. Foronda, C. Brandl, H.-J. Lugauer, M. P. Hoffmann, Martin Albrecht
Proceedings Volume PC12441, PC124410G (2023) https://doi.org/10.1117/12.2649967
KEYWORDS: Aluminum nitride, Gallium, Aluminum, Scanning electron microscopy, Etching, Transmission electron microscopy, Diffusion, X-ray diffraction, Surface finishing, Wet etching

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top