Dr. Sven Burger
at Konrad-Zuse-Zentrum für Informationstechnik Berlin
SPIE Involvement:
Conference Program Committee | Author
Websites:
Publications (79)

PROCEEDINGS ARTICLE | September 26, 2018
Proc. SPIE. 10745, Current Developments in Lens Design and Optical Engineering XIX
KEYWORDS: Refractive index, Optical design, Optical properties, Scattering, Nanoparticles, Particles, Composites, Magnetism, Mie scattering, Nanocomposites

PROCEEDINGS ARTICLE | September 18, 2018
Proc. SPIE. 10731, Nanostructured Thin Films XI
KEYWORDS: Thin films, Nanostructuring, Silicon, Numerical simulations, Thin film solar cells, Optical simulations, Nanostructured thin films, Tandem solar cells, Absorption, Perovskite

PROCEEDINGS ARTICLE | May 28, 2018
Proc. SPIE. 10694, Computational Optics II
KEYWORDS: Optical design, Metrology, Diffractive optical elements, Silicon, Scatterometry, Inverse problems, Finite element methods, Optimization (mathematics), Stochastic processes, Inverse optics

PROCEEDINGS ARTICLE | May 22, 2018
Proc. SPIE. 10688, Photonics for Solar Energy Systems VII
KEYWORDS: Antireflective coatings, Solar cells, Silicon, Reflectivity, Finite element methods, Tandem solar cells, Absorption, Perovskite

PROCEEDINGS ARTICLE | May 17, 2018
Proc. SPIE. 10683, Fiber Lasers and Glass Photonics: Materials through Applications
KEYWORDS: Multimode fibers, Optical fibers, Modeling, Photonic crystal fibers, Waveguides, Single mode fibers, Finite element methods

PROCEEDINGS ARTICLE | May 17, 2018
Proc. SPIE. 10683, Fiber Lasers and Glass Photonics: Materials through Applications
KEYWORDS: Optical fibers, Modeling, Scattering, Sensors, Polymers, Coating, Manufacturing, Optical testing

Showing 5 of 79 publications
Conference Committee Involvement (8)
Modeling Aspects in Optical Metrology VII
24 June 2019 | Munich, Germany
Computational Optics 2018
16 May 2018 | Frankfurt, Germany
Modeling Aspects in Optical Metrology
26 June 2017 | Munich, Germany
Modeling Aspects in Optical Metrology V
23 June 2015 | Munich, Germany
Modeling Aspects in Optical Metrology IV
13 May 2013 | Munich, Germany
Showing 5 of 8 published special sections
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