Sven Schönfelder
Managing Director at INSION GmbH
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Confocal microscopy, Optical components, Light sources, Polymethylmethacrylate, Diffractive optical elements, Sensors, Colorimetry, Head, Optical alignment, Signal detection

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