Svetlana Lyatun
at Immanuel Kant Baltic Federal Univ
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 April 2021 Paper
Proc. SPIE. 11776, EUV and X-ray Optics, Sources, and Instrumentation
KEYWORDS: Gold, Thin films, Visible radiation, Interferometers, X-rays, Reflectivity, Reflectometry, Synchrotrons, Spatial resolution, X-ray imaging

Proceedings Article | 18 April 2021 Paper
Proc. SPIE. 11776, EUV and X-ray Optics, Sources, and Instrumentation
KEYWORDS: Thin films, Multilayers, X-ray optics, Sensors, X-rays, X-ray sources, Interferometry, Temporal resolution, Synchrotrons, X-ray detectors

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Thin films, Refractive index, X-ray optics, Lenses, Sensors, X-rays, Silicon, Reflectivity, Spatial resolution

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Thin films, X-ray optics, Lenses, Sensors, X-rays, X-ray sources, Silicon, Interferometry, Reflectometry

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