Dr. Sybren J. Sijbrandij
at FEI Co
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 6, 2004
Proc. SPIE. 5567, 24th Annual BACUS Symposium on Photomask Technology
KEYWORDS: Computational fluid dynamics, Gases, Computing systems, 3D modeling, Ion beams, Photomasks, Statistical modeling, Photomask technology, Systems modeling, Process modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top