The behavior of the optical vortices with fractional topological charges in the far-field is assessed through numerical modeling and confirmed by experimental results. The generation of fractional topological charge variations of the phase within a Gaussian beam was achieved by using a liquid crystal spatial light modulator (LCoS SLM). It is shown that a laser beam carrying an optical vortex with a fractional topological charge evolves into a beam with a topological charge of integer value, specifically an integer value closer to the fractional number in the far field. A potential application of this work is for data transmission within optical telecommunication systems.
A method to generate an optical metasurface is developed. In our experimental setup, we use a pump-probe technique,
where the pump beam is used to project patterns of v-shaped antennas on the surface of a silicon substrate. In the areas
illuminated with the images of v-shaped antennas electron-hole pairs are created. Therefore, the antenna structures on
silicon will have metallic-like properties, we classify this structure as a metasurface. The THz beam probes refraction
and reflection on the metasurface generated on the silicon substrate. The dynamic change of these patterns of
metasurface causes the beam steering effects of THz radiation.
An innovative method of examining properties of metasurfaces is presented. A pump-probe technique is used to create a metasurface composed of conductive shapes on a silicon surface. A wave-front of intense pulse of 82 fs from Ti:Sa laser with wavelength of 800 nm is shaped by a spatial light modulator and then focused into a preprogrammed array of vshaped features on a high purity float zone silicon substrate. The laser pulse generates electron-hole pairs on the silicon substrate, thus a metasurface consisting of an array of metal-like v-shaped antennas is inscribed on the silicon substrate. The lifetime of v-shaped antennas is in millisecond time range. In the meantime, the second, less intense pulse, also of wavelength 800 nm is converted to a pulse of terahertz radiation with a peak-power at wavelength approximately 800 μm and used to probe the metasurface inscribed in the silicon. Tracing the position of the refracted terahertz beam is achieved with a specially designed INO video camera for terahertz radiation.