Tae-Hwa Kim
at Satrec Initiative Co Ltd
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 10, 2008
Proc. SPIE. 7109, Image and Signal Processing for Remote Sensing XIV
KEYWORDS: Radar, Data modeling, Scattering, Synthetic aperture radar, Image processing, Reflectivity, Image analysis, Image quality, Antennas, Device simulation

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