Tae Hyun Kim
at National Nanofab Ctr
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 19 June 2013 Paper
Hee Yeoun Kim, Chungmo Yang, Jae Hong Park, Ho Jung, Taehyun Kim, Kyung Tae Kim, Sung Kyu Lim, Sang Woo Lee, Jay Mitchell, Wook Joong Hwang, Kwyro Lee
Proceedings Volume 8704, 87043E (2013) https://doi.org/10.1117/12.2015738
KEYWORDS: Semiconducting wafers, Microbolometers, Sensors, Resistance, Packaging, Reliability, Wafer bonding, Wafer testing, Wafer-level optics, Amorphous silicon

Proceedings Article | 15 October 2012 Paper
Myeongho Song, Eunmi Park, Moon Hyun, Tae Kim, Hee Kim, Gawon Lee
Proceedings Volume 8512, 85120P (2012) https://doi.org/10.1117/12.928346
KEYWORDS: Silicon, Transmittance, Silicon films, Infrared sensors, Antireflective coatings, Zinc, Germanium, Semiconducting wafers, Sensors, Autoregressive models

Proceedings Article | 31 May 2012 Paper
Myeongho Song, Tae Hyun Kim, Moon Seop Hyun, Jae Hong Park, Hee Yeoun Kim, Gawon Lee
Proceedings Volume 8353, 83532B (2012) https://doi.org/10.1117/12.918982
KEYWORDS: Silicon, Transmittance, Semiconducting wafers, Infrared sensors, Sensors, Absorption, Oxygen, Packaging, Microelectromechanical systems, Germanium

Proceedings Article | 31 May 2012 Paper
Taehyun Kim, Kimyung Kyung, Jae Hong Park, Young Su Kim, Sung Kyu Lim, Kyungmin Kim, Kwyro Lee, C. Welham, Hee Yeoun Kim
Proceedings Volume 8353, 83531B (2012) https://doi.org/10.1117/12.918916
KEYWORDS: Microbolometers, Readout integrated circuits, Sensors, Thermography, Resistance, Capacitance, Semiconducting wafers, Materials processing, Amorphous silicon, Infrared imaging

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