Prof. TaeHoon Kim
at KAIST
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 February 2006
Proc. SPIE. 6090, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
KEYWORDS: Confocal microscopy, Diffraction, Optical filters, Microscopy, Luminescence, Image resolution, Numerical simulations, Solids, Shape analysis, Stimulated emission depletion microscopy

Proceedings Article | 23 February 2006
Proc. SPIE. 6090, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
KEYWORDS: Actuators, Signal to noise ratio, Confocal microscopy, 3D image reconstruction, Image processing, Microscopy, 3D modeling, Time metrology, 3D metrology, 3D image processing

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