Prof. Tai-Wook Kim
Professor
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 2 January 2014
JEI Vol. 23 Issue 01
KEYWORDS: Tomography, Critical dimension metrology, Thin films, Transistors, LCDs, Coherence (optics), Imaging systems, Visibility, Fused deposition modeling, Overlay metrology

SPIE Journal Paper | 14 September 2012
JEI Vol. 21 Issue 3
KEYWORDS: Lawrencium, Reconstruction algorithms, Glasses, Microscopes, Image processing, Imaging systems, Distance measurement, Image restoration, Objectives, Cameras

Proceedings Article | 21 August 2009 Paper
Proc. SPIE. 7409, Thin Film Solar Technology
KEYWORDS: Amorphous silicon, Femtosecond phenomena, Copper indium disulfide, Glasses, Resistance, Laser ablation, Thin film solar cells, Picosecond phenomena, Molybdenum, Pulsed laser operation

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top