Taisia O. Berestok
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 September 2013 Paper
Proceedings Volume 8823, 88230Q (2013) https://doi.org/10.1117/12.2023238
KEYWORDS: Zinc oxide, Zinc, Thin films, Crystals, X-rays, Reflection, Thin film deposition, X-ray diffraction, Scanning electron microscopy, Scattering

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