Taisir Marzook
Process Engineer - Lithography at Intel Corp
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | March 28, 2016
Proc. SPIE. 9779, Advances in Patterning Materials and Processes XXXIII
KEYWORDS: Wafer-level optics, Optical lithography, Etching, Image processing, Scanners, Photomasks, Directed self assembly, Optical alignment, Semiconducting wafers

PROCEEDINGS ARTICLE | March 20, 2015
Proc. SPIE. 9425, Advances in Patterning Materials and Processes XXXII
KEYWORDS: Optical lithography, Etching, Image processing, Silicon, Scanning electron microscopy, Photomasks, Directed self assembly, Optical alignment, Semiconducting wafers, System on a chip

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