Dr. Takahiro Ohnakado
at Mitsubishi Electric Corp
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 31 May 2012
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Staring arrays, Thermography, Reticles, Optical lithography, Silicon, Photography, Temperature sensors, Diodes, Infrared radiation, Semiconducting wafers

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Staring arrays, Infrared detectors, Thermography, Diffusion, Photography, Scanning electron microscopy, Temperature sensors, Diodes, Infrared radiation, Temperature metrology

Proceedings Article | 7 May 2009
Proc. SPIE. 7298, Infrared Technology and Applications XXXV
KEYWORDS: Infrared cameras, Thermography, Reflectors, Modulation, Temperature sensors, Diodes, Infrared radiation, Integrated circuits, Integrated circuit design, Temperature metrology

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