Takahiro Saito
at Natsume Optical Corp
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Mirrors, X-ray optics, Precision measurement, Profilometers, Spatial resolution, X-ray imaging

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Monochromatic aberrations, Mirrors, Optical design, X-ray optics, Error analysis, X-rays, Wavefront analysis, Tolerancing, X-ray technology, Wavefront metrology

Proceedings Article | 20 September 2016 Presentation + Paper
Proc. SPIE. 9982, Unconventional Imaging and Wavefront Sensing XII
KEYWORDS: Diffraction, Holograms, Wavefronts, Optical testing, CCD cameras, Spatial light modulators, Phase retrieval, Charge-coupled devices, Helium neon lasers, Spiral phase plates

Proceedings Article | 12 October 2015 Paper
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Monochromatic aberrations, Mirrors, X-rays, Laser development, Wavefronts, CCD cameras, Phase retrieval, Transmittance, Charge-coupled devices, X-ray characterization

Proceedings Article | 26 August 2015 Paper
Proc. SPIE. 9588, Advances in X-Ray/EUV Optics and Components X
KEYWORDS: Mirrors, Visible radiation, X-ray optics, Metrology, X-rays, Wavefront sensors, Wavefronts, CCD cameras, Phase retrieval, Charge-coupled devices

Showing 5 of 8 publications
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