Takaho Saito
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 July 2019
Proc. SPIE. 11172, Fourteenth International Conference on Quality Control by Artificial Vision
KEYWORDS: Statistical analysis, X-ray computed tomography, Defect detection, Error analysis, X-rays, Inspection, Computer programming, Feature extraction, Neural networks, X-ray imaging

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