Prof. Takamasa Suzuki
Professor at Niigata Univ
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (90)

PROCEEDINGS ARTICLE | December 9, 2015
Proc. SPIE. 9792, Biophotonics Japan 2015
KEYWORDS: Biosensing, Optical sensing, Biomedical optics, Tissues, Optical coherence tomography, Fourier transforms, Interferometry, Tomography, Heterodyning, Vibrometry, 3D metrology, Tissue optics, Electronic filtering, Natural surfaces

PROCEEDINGS ARTICLE | September 24, 2015
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Mirrors, Light sources, Optical coherence tomography, Glasses, Semiconductor lasers, CCD cameras, Acousto-optics, Strontium, Camera shutters, Diffraction gratings

SPIE Journal Paper | August 25, 2015
OE Vol. 54 Issue 08
KEYWORDS: Modulation, Phase shifts, Mirrors, Interferometers, CCD cameras, Phase shift keying, Signal detection, Semiconductor lasers, Charge-coupled devices, Signal processing

SPIE Journal Paper | August 21, 2014
OE Vol. 53 Issue 08
KEYWORDS: Interferometry, Interferometers, 3D scanning, Phase interferometry, Phase shifts, Signal detection, Charge-coupled devices, Phase measurement, Mirrors, Avalanche photodetectors

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Mirrors, Phase shifting, Avalanche photodetectors, Interferometers, Fourier transforms, Interferometry, 3D metrology, Charge-coupled devices, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Visible radiation, Spatial frequencies, Interferometers, Optical coherence tomography, Semiconductor lasers, CCD cameras, Image sensors, Optical alignment, Cylindrical lenses, Acousto-optics

Showing 5 of 90 publications
Conference Committee Involvement (7)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, Maryland, United States
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
Showing 5 of 7 published special sections
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