Mr. Takashi Fujimoto
Theoretical Error Analysis at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 25, 2004
Proc. SPIE. 5603, Machine Vision and its Optomechatronic Applications
KEYWORDS: Statistical analysis, Visualization, Imaging systems, Cameras, Calibration, Error analysis, Distortion, 3D metrology, Machine vision, Device simulation

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top