Takashi Fuse
at Fujitsu Labs Ltd
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 6 March 2013
Proc. SPIE. 8661, Image Processing: Machine Vision Applications VI
KEYWORDS: Optical systems, Modulation, Cameras, Coating, Inspection, Reflectivity, Phase shift keying, Specular reflections, Phase shifts, Defect inspection

Proceedings Article | 8 October 2004
Proc. SPIE. 5515, Nanoengineering: Fabrication, Properties, Optics, and Devices
KEYWORDS: Thin films, Ferroelectric materials, Polarization, Birefringence, Sensors, Crystals, Polarizers, Near field scanning optical microscopy, Near field, Near field optics

Proceedings Article | 2 February 1998
Proc. SPIE. 3306, Machine Vision Applications in Industrial Inspection VI
KEYWORDS: Diffraction, Monochromatic aberrations, Mirrors, Sensors, Inspection, Semiconductor lasers, Data acquisition, Laser scanners, Sensing systems, Acoustics

Proceedings Article | 3 October 1995
Proc. SPIE. 2597, Machine Vision Applications, Architectures, and Systems Integration IV
KEYWORDS: Sensors, Image processing, Laser development, Inspection, Laser welding, CCD cameras, Image sensors, 3D metrology, Algorithm development, 3D image processing

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